- Main customer
- About us
- Contact
- Downloads
- Privacy policy
- Sitemap
- 未分類
- Accessories Tools
- Applications
- Isolation of μm-size particles for FT-IR, Raman and SEM
- Scraping thin sections of material from a surface
- Microwelding and various sampling for materials science and geoscience
- Ex-situ FIB lift-out
- Sample marking for SEM
- DAC loading for high pressure
- Precise cutting of samples
- Probing for electric measurement
- Automatic collection and sorting of grains
- Sampling inside a glove box
- Attachment of colloidal probes to cantilevers for AFM measurements
- Cell isolation
- Exhibition
- 【Photonics West 2020(Feb 4-6)】
- 【2019 MRS Fall Meeting & Exhibits(Dec 1-6)】
- 【ISTFA 2019(Nov 10-14)】
- 【SciX 2019(Oct 13-18)】
- 【EHPRG2019(Sep 1-6)】
- 【Microscopy & Microanalysis 2019 Meeting(Aug 4-8)】
- 【PRESSYNC 27th(July 31-Aug 2)】
- 【SEMICON WEST 2019(July 9-11)】
- 【AIC FAIC ANNUAL MEETING(May 13-17)】
- 【Golden Gate Polymer Forum(May 7-8)】
- 【SAFS & ASTEE JOINT MEETING(May 1-3)】
- 【Analitika Expo 2019(Apr 23-26)】
- 【2019 MRS Spring Meeting & Exhibit(Apr 22-26)】
- 【2018 MRS Fall Meeting & Exhibit(Nov 25-30】
- 【第17届深圳共同测试・试验设备展览会(Nov15-16)】
- 【analytica China2018(Oct 31-Nov2)】
- 【ISTFA 2018(Oct 28-Nov 1)】
- 【SciX 2018(Oct 21-26】
- 【Microscopy & Microanalysis 2018(AUG 5-9) 】
- 【Goldschmidt 2018(AUG 12-17)】
- 【Compres 2018(AUG 5-8)】
- 【EHPRG 2018(SEP 2-7)】
- 【IPFA 2018(JUL 16-19)】
- analytica 2018
- AGU 2017 Fall Meeting
- 2017 MRS Fall Meeting
- ISTFA 2017
- SciX 2017
- 2017 MRS Spring
- LPSC 2017
- ISTFA/2016
- 2016 IUCr High-Pressure Workshop
- EHPRG2016
- 2016 COMPRES Annual Meeting
- Inter/Micro 2016
- Analytica 2016
- EMAG 2016
- 2016 MRS Spring
- Microscope built-in type Micromanipulator
- News
- MICRO TOOLS & ACCESSORIES SELECTION GUIDE
- Chinese catalog（简体字 & 繁體字）
- New Release of “Pinpoint Marking System D-MARK”
- Example of customized Axis Pro
- New Release of “Electronic Microtweezer Tool Set”
- You can check leaflets of accessories.
- Our manipulation system "Axis Pro" was shown on the TV program
- New Release of "Probe Bender" Product.
- Stand-alone Micromanipulator
- Applications2
- Substance on a surface Picking up a substance & transferring it
- Exposed surface of buried subject Removal of disused part
- Dig buried substance Isolation
- Contamination in adhesive material Grasp a subject and delivery
- FIB Lift-out Posture control and deliver (10 micro meters)
- Marking on hard material Possible to mark less 5μm line width
- Pick up substance in a tiny hole
- Adsorb and release pico-liter liquid
- Collect few-um size substances
- Pick up material from one layer of a multilayer structure
- Cut to depth direction
- Handles 5um-size wiring
- Handling electric parts
- Handling tiny particle
- Marking on PE resin sheet
Application
 Isolation of μm-size particles for FT-IR, Raman and SEM |
| Scraping thin sections of material from a surface |
| Microwelding and various sampling for materials science and geoscience |
| Ex-situ FIB lift-out |
| Sample marking for SEM |
| DAC loading for high pressure |
News&Topics
| MICRO TOOLS & ACCESSORIES SELECTION GUIDE() |
| Chinese catalog（简体字 & 繁體字）() |
| New Release of “Pinpoint Marking System D-MARK”() |
| Example of customized Axis Pro() |
| New Release of “Electronic Microtweezer Tool Set”() |
-
Resolves an issue related to particulate sampling. Knowledgeable staff will answer. -
If you would like to consider the introduction, already your material for those of you can see immediately.
Micro Support Co.,Ltd.
1-3-19 Sikiji,Suruga-ku, Shizuoka-City,Shizuoka 422-8036,Japan
Phone ＋81-54-269−5002
FAX ＋81-54-269−5003
|
|
Copyright (C) 2015 microsupport.co.jp All right reserved.