Bent Tungsten Probes with our Probe Bender enable collection/removal of foreign substances of a few μm from a hole of tens μm

・Sample: Ink nozzle of an inkjet printer
・Tool: Probe Bender
・Application: Removal of foreign substances of several μm in a hole of several tens of μm
・Features: Bent Tungsten Probes with our Probe Bender enable collection/removal of foreign substances of a few μm from a hole of tens μm

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Resolves issues related to particulate sampling.
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