Description
- Fully-covered and open-type models available for various operational needs.
- PC mouse-operated, microscope-integrated electric micromanipulator for seamless handling and transfer of microscopic samples.
- Supports diverse applications, including FT-IR microscopy of foreign substances, collection of FIB-processed TEM thin samples, and precise marking.
Axis Pro Features
- Consistently sample ≥5μm objects with precision and ease
- Efficient particle removal in cleanroom environments made possible
- Fully covered and enhanced safety, operability, and precision
- Once the sample is placed, execute the desired operation with a PC mouse
- Standard-equipped: Motorized second stage for seamless sample transfer
- Program-controlled error-free sample transfer
- Built-in storage space for keeping accessories
- Simplified setup with the use of angle-fixed arms.
Standard Equipment Package
- Main Unit
- Electric Zoom Microscope
- Motorized Focus Control
- Motorized Arms
- Motorized X-Y Stage
- USB Digital Camera (AP-FE) / GigE Camera (APFC)
- LED Reflection & Transmission Illumination Unit
- Dedicated Control System
- High-Precision Zoom Objective Lens
Note: This list includes the core components found in each unit. For a detailed breakdown of specific set inclusions, please inquire.
Accessories (Option)
- High-precision Electric Rotator – FIB lift-out
- Electric Microtweezers : Grasping/picking up & releasing objects of ~30μm
- Rotational Electric Stage : Optimizing the sample orientation
- Bi-axis Rotational Electric Stage : Coordinate orientation control of the sample and transfer location
- Rotational Mechanical Stage : Ideal for fine adjustments during cutting and milling
- Mechanical Bi-axis Sample Holder : Ideal for adjusting the sample parallelism
- Darkfield illumination : For discerning fine scratches and foreign substances
- Tilted Illumination Adapter : improves contrast, e.g. for undulating substances
Axis Pro applicable Main Analytical Method
- TEM – Transmission Electron Microscopy
- SEM – Scanning Electron Microscope
- FIB – Focused Ion Beam
- SPM – Scanning Probe Microscope
- ToF-SIMS – Time-of-Flight Secondary Ion Mass Spectrometry
- FTIR- Fourier-transform infrared spectroscopy
- uFTIR – micro Fourier Transform Interferometer
- Raman spectroscopy
- uRaman – Raman Laser Spectrometer
- XRD – X-Ray Diffraction
- WDXRF –Wavelength Dispersive type X-Ray Fluorescence analysis
- EDXRF – Energy Dispersive type X-Ray Fluorescence analysis
- GC/MS – Gas Chromatography – Mass Spectrometry
- LC/MS – Liquid Chromatography – Mass Spectrometry
- EPMA – Electron Probe Micro Analyser
- NMR – Nuclear Magnetic Resonance